Optimized connection
The control unit of the ADDA³ can be placed in the immediate proximity of the microscope electronics. This minimizes the danger of interference from external signals, guaranteeing optimum signal fidelity. The connection to the PC is via FireWire. This technology guarantees fast and efficient data transfer even over longer distances. Customizing the ADDA³ to virtually any microscope on the market is very simple, since all calibration parameters are controlled by the software.

Image and Mapping inputs
The ADDA³ offers simultaneous acquisition of multiple images and multiple element maps. Various signals can be acquired during scanning due to 4 digital/analog input channels – each of which has 14-bit resolution. The ADDA³ provides 16 digital counting inputs (32 bit, 8 MHz, TTL) for acquiring elemental distribution maps. All ADDA³ inputs have been optimized for lowest noise and highest fidelity. Specialized technology adjusts input characteristics for the various electron microscopy operation modes (integration time, bandwidth, etc).

Maximum resolution
ADDA³'s X and Y resolution can be controlled independently – between 1 and 12,000 pixels, offering a maximum of flexibility in pixel density. This is not generally available for standard microscope operation. The dwell time can be adjusted by the user, ranging between 20 ns to 2 sec.

High dynamic range
The digital/analog input signals of the detector (passive or active mode) are digitized to 14-bit accuracy synchronously with the beam and transferred into the frame buffer of the computer. This provides 16,384 gray levels for each pixel.

Combination with EDS systems
When used in conjunction with EDS systems, the ADDA³ can acquire an element distribution map at any resolution by counting characteristic X-ray emissions. During the user-definable dwell time of the electron beam on one location of the sample, the ADDA³ counts the EDS pulses from various different energy channels and digitizes the SE/BSE signal of the microscope detector. The resulting element distribution maps can be displayed simultaneously with the SE and BSE images, or can be superimposed on these images as overlays.

Image Information
The ADDA³ is fully integrated with Scandium and iTEM, the SEM and TEM imaging platforms by Olympus Soft Imaging Solutions. Images and element maps saved with these platforms contain all the acquisition parameters and are calibrated directly. When conducting post processing, zooming, or cropping, this information is maintained in the new image as well. Each parameter is transferred into the database or specially designed report templates automatically.

Image enhancement
In addition to all standard image-processing functions, iTEM and Scandium include a number of newly developed tools and filters (e.g., DCE, Rank, Sigma) to improve the acquired images.

Archiving
The entire structure of the Microsoft Access-compatible database can be defined according to the user's needs – by the user. Custom fields, such as microscope name, project number, user, etc. are easy to define. These fields will be saved with the images upon insertion into the database and can be used as search criteria for subsequent queries.  All documents associated with the image can be recalled with the image at the click of a button.

Reporting
Reports can be generated with the drag of a mouse by using custom-designed report templates.  Images and data are placed on the templates by drag-and-drop from the database or the image buffers.

Solutions
Scandium and iTEM can be further expanded according to your individual needs via a wide range of specially developed solutions. Users can thus put together a personalized software solution for their particular application. All solutions work together seamlessly with each other and with the ADDA³.