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The Scandium Solution Metrology is comprised of special functions for automatically measuring object structures.
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Automatic calliper tool for object structures
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Determines coordinates, intercepts, angles, radii and distances
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Automatic execution of recurring measurement
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Line width measurements on semiconductor structures
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Statistical evaluation of critical dimensions (CD)
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Thickness of single or multiple layers of cross-sectional samples
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ADDA3 - SEM / STEM Scan Interface
Upgrade your old analog or digital scanning electron microscope to a modern high performance device.
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