The Scandium Solution Metrology is comprised of special functions for automatically measuring object structures.



Automatic calliper tool for object structures
Determines coordinates, intercepts, angles, radii and distances
Automatic execution of recurring measurement
Line width measurements on semiconductor structures
Statistical evaluation of critical dimensions (CD)
Thickness of single or multiple layers of cross-sectional samples
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Key Features Specifications Applications
Add-in Description
act Signal/image processing: Original, Noise filtered, First and second derivative

Peak detection methods: Cut, Relative, Absolute

Threshold methods: Edge, Slope, Regression

Measuring parameters: Length, Distance, Angle, X-Position, Y-Position

Data output: Sheet, Overlay
LineWidth Signal/image processing: Original, Noise filtered, derivative

Peak detection methods: Cut, Relative, Absolute

Threshold methods: Edge, Slope, Regression, Cracks

Measuring parameters: width, Pitch-left, Pitch-right, Space, Total distance, Left border, Right border, Y-value

Data output: Sheet, Overlay

Verification methods: Sheet / image link, Image / sheet link

Statistic evaluation: Count, Mean value, Standard deviation

Data filtering: Filtering by standard deviation, Manual filtering
LTM (Layer Thickness Measurements) Convenient tool for measuring layer thicknesses in cross sections

Supports any layer geometry and orientation

Supports multiple layers - coherent or not coherent

Concept of neutral fibers for high precision measurements

Multitude of neutral fiber definable

Result sheet includes statistics

Support of tolerances for every single layer

Layer structures can be saved for later use including all parameters
Imaging C Programming language with macro recording, interpreter and compiler

Scripting of named arguments

Integrated MDI editor and command window

Integrated debugger

Function and symbol browser

Comprehensive function and object library






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