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The Scandium Solution X-Ray combines several tools for dealing with microanalysis systems.
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Controlling x-ray analysis devices
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Image and spectrum acquisition from EDS
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Combination of morphological and chemical information
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Detected particles may be used as positions for the spectral acquisitions
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Peak label information
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ADDA3 - SEM / STEM Scan Interface
Upgrade your old analog or digital scanning electron microscope to a modern high performance device.
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