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The Scandium Solution X-Ray combines several tools for dealing with microanalysis systems.
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Controlling x-ray analysis devices
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Image and spectrum acquisition from EDS
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Combination of morphological and chemical information
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Detected particles may be used as positions for the spectral acquisitions
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Peak label information
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| Add-in |
Description |
| Pascal |
Electron image and X-Ray spectrum acquisition with integrated archiving
Acquisition of spectra at interactive points, lines and areas
Automatic spectrum acquisition of detected particles (in conjunction with the Scandium Solution Detection)
Acquisition at the optimum particle position or scanning of the whole particle
Quantification of the EDS spectra (depending on EDS system)
Adding of X-Ray peak label information |
| Imaging C |
Programming language with macro recorder, interpreter and compiler
Scripting of named arguments
Integrated MDI editor and command window
Integrated debugger
Function and symbol browser
Comprehensive function and object library |
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ADDA3 - SEM / STEM Scan Interface
Upgrade your old analog or digital scanning electron microscope to a modern high performance device.
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