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Controlling x-ray analysis devices
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Image and spectrum acquisition from EDS
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Combination of morphological and chemical information
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Detected particles may be used as positions for the spectral acquisitions
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Peak label information
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The Scandium Solution X-Ray combines several tools for dealing with microanalysis systems. Quantified and combined morphological and chemical information are examined automatically with this Solution. Pascal (Particle scan and analysis) controls x-ray analysis devices. It captures both electron images and x-ray spectra from the EDS system. Used in conjunction with the Scandium Solution Detection, the coordinates of the detected particles may be used as positions for spectral acquisitions. This is then combined with the morphological data of the x-ray analysis. Individual peaks of imported EDS spectra can be assigned – automatically or manually – to the corresponding chemical element. In addition, an active ADDA II Slowscan interface for active image acquisition with scanning microscopes (SEM, STEM) means that up to 16 counters may be used simultaneously for the acquisition of elemental mappings. Count rates can be displayed as false-color images.
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