The Scandium Solution X-Ray combines several tools for dealing with microanalysis systems. Controlling x-ray analysis devices Image and spectrum acquisition from EDS Combination of morphological and chemical information Detected particles may be used as positions for the spectral acquisitions Peak label information Back to product overview Key Features Specifications Applications Add-in Description Pascal Electron image and X-Ray spectrum acquisition with integrated archiving Acquisition of spectra at interactive points, lines and areas Automatic spectrum acquisition of detected particles (in conjunction with the Scandium Solution Detection) Acquisition at the optimum particle position or scanning of the whole particle Quantification of the EDS spectra (depending on EDS system) Adding of X-Ray peak label information Imaging C Programming language with macro recorder, interpreter and compiler Scripting of named arguments Integrated MDI editor and command window Integrated debugger Function and symbol browser Comprehensive function and object library

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