The iTEM Solution EFTEM combines the functionality of a general image processing system with methods and techniques specifically developed for energy filtered transmission electron microscopy.





Key Features Specifications Applications
Integrated EELS atlas containing reference spectra
Remote control of EFTEM and periphery devices
Generating and processing ESI element maps and EELS spectra
Numerous options of energy and intensity calibration
iTEM Solution EFTEM offers acquisition, processing and evaluation routines for all prevailing methods of energy-filtered electron microscopy. This applies to the Image EELS and ESI methods, both being methods mainly used for analysis and visualization of even the lowest levels of element concentration. The software offers fast and effortless generation of highly resolved element diffraction maps accompanied by extensive information on the chemical composition of the structure. Parallel and serial EELS spectra can also be acquired using iTEM Solution EFTEM. When conducting more extensive analysis, spectra can be quantified within the software, and specimen thickness can be determined right away. iTEM Solution EFTEM also offers an impressive variety of spectra-processing functions. This solution includes an EELS atlas with a wide range of reference spectra as well as automatic generation of spectral information.

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iTEM Solution EFTEM
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