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Automatically analyzing and indexing of digital electron diffraction pattern
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Determination of reciprocal units
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Readout of camera length directly
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The iTEM Solution Diffraction is the extension level for digital electron diffraction pattern analysis which provides important information on the microstructure of crystalline materials. The Solution Diffraction enables the TEM user to automatically analyze and index diffraction patterns of both single crystalline and polycrystalline samples and FFTs. Diffraction patterns are calibrated directly in corresponding reciprocal units according to the camera length read out from the TEM if applicable. The range of functions includes highly accurate measurement of distances and angles as well as functions for archiving and reporting – all integrated within the comprehensive interactive measurement features of iTEM.
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