The iTEM Solution EFTEM combines the functionality of a general image processing system with methods and techniques specifically developed for energy filtered transmission electron microscopy.



Integrated EELS atlas containing reference spectra
Remote control of EFTEM and periphery devices
Generating and processing ESI element maps and EELS spectra
Numerous options of energy and intensity calibration
Back to product overview
Key Features Specifications Applications
Add-in Description
ESI R-Map
Drift correction
Analyzing
Convenient display of elemental maps by various image
mixing/ superimposition functions
Image EELS Drift correction
ESI mapping
Quality check (movie of planes)
Various ROI selection tools (eg, magic wand)
Spectrum display in real time
Parallel EELS Direct acquisition of spectra to CCD camera
Acquisition control: time or surface accumulation
Automatic calibration and control of gain and energy shift
Wide range P-EELS supported
Serial EELS
Spectra Processing EELS Atlas with reference spectra for all common elements
Auto scaling
Single or multiple spectra (up to 8 spectra simultaneously)
Display filters and numerical filters
Automatic peak identification, automatic element labelling
Zero-loss calibration
Integration, background subtraction
Deconvolution: Fourier log
Gain-split functionality
Quantification Element ratio and ratio map
Compute specimen thickness from spectrum
and/or image (interactive)
Others Automatic generation of spectrum information saved with the image