Münster, September 2006 - Olympus Soft Imaging Solutions released the new Scandium Solution X-Ray. The new software combines several tools for dealing with EDS microanalysis systems.
Pascal (Particle scan and analysis) controls X-ray analysis devices. It captures both electron images and X-ray spectra from the EDS system. Used in conjunction with the Scandium Solution Detection, the coordinates of the detected particles may be used as positions for spectral acquisitions. This is then combined with the morphological data of the X-ray analysis.
Individual peaks of imported EDS spectra can be assigned – automatically or manually – to the corresponding chemical element. In addition, an ADDA Slowscan interface for active image acquisition with scanning microscopes (SEM, STEM) means that up to 16 counters may be used simultaneously for acquiring elemental mappings. Count rates can be displayed as false-color images. Quantified and combined morphological and chemical information are examined automatically using this Solution.