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The iTEM Solution Diffraction is the extension level for digital electron diffraction pattern analysis which provides important information on the microstructure of crystalline materials.
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Automatically analyzing and indexing of digital electron diffraction pattern
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Determination of reciprocal units
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Readout of camera length directly
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The iTEM Solution Diffraction extension makes it possible to automatically index, evaluate, measure and analyze diffraction patterns. As with all other extensions, the iTEM Diffraction is fully integrated with iTEM. The base-level version offers numerous functions for processing, analysis, visualization and archiving of images and other data as well as for automation and report generation. With its solution-oriented software extensions, iTEM's range of functions can be precisely expanded according to the user's needs.
Indexing diffraction patterns
Via iTEM Diffraction, diffraction patterns (SAED) of both single crystalline and polycrystalline samples can be indexed. After the crystal structure and lattice parameters have been defined, indexing is conducted via threshold detection (automatically) or via definition of the two g vectors (manually). Alongside the Miller indices, the zone axis is shown as the indexing result within the image overlay. The related lattice distances may be listed in a sheet automatically as needed. All data, including the image information is saved with the diffraction image.
Measuring within diffraction images
The Diffraction iTEM Solution offers easy analysis of diffraction patterns. Lattice plane distances are simple to measure as well as the angles between two different planes. The integrated snap function - which can be switched on and off - ensures the greatest possible precision. The snap function locates the brightest ambient point automatically and then uses this as a point of measurement.
Required Accessories
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