The iTEM Solution Diffraction is the extension level for digital electron diffraction pattern analysis which provides important information on the microstructure of crystalline materials. Automatically analyzing and indexing of digital electron diffraction pattern Determination of reciprocal units Readout of camera length directly Back to product overview Key Features Specifications Applications Add-in Description Calibration Automatic: when using remote-capable TEMs, diffraction patterns are calibrated immediately following acquisition Automatic or manual determination of central spot position Indexing Automatic: via threshold detection Manual: by defining g vectors Single crystalline and polycrystalline materials are supported Calculation and display of zone axes Lattice plane distances shown in sheets following indexing Measurements Distances between lattice planes Angles between lattice planes The integrated snap function (which can be switched on and off) ensures the greatest possible precision when locating the brightest ambient point Edit, delete and add measurements Online statistics Show measurement results in sheets and graphically Automatic filtering Export to MS Excel

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